The characterization of structural disorder in thin films at elevated temperatures by spectroscopic methods

Journal article


Publication Details


Author list: Rabolt J, Rabe J, Brown C, Swalen J

Journal: Proceedings of SPIE - The International Society for Optical Engineering

Publication year: 1985

Volume number: 553

DOI: 10.1117/12.970931

URL: http://www.scopus.com/inward/record.url?eid=2-s2.0-84915238189&partnerID=MN8TOARS



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