The characterization of structural disorder in thin films at elevated temperatures by spectroscopic methods

Journal article

Publication Details

Author list: Rabolt J, Rabe J, Brown C, Swalen J

Journal: Proceedings of SPIE - The International Society for Optical Engineering

Publication year: 1985

Volume number: 553

DOI: 10.1117/12.970931



Last updated on 2020-16-06 at 20:47