The characterization of structural disorder in thin films at elevated temperatures by spectroscopic methods
Journal article
Publication Details
Author list: Rabolt J, Rabe J, Brown C, Swalen J
Journal: Proceedings of SPIE - The International Society for Optical Engineering
Publication year: 1985
Volume number: 553
DOI: 10.1117/12.970931
URL: http://www.scopus.com/inward/record.url?eid=2-s2.0-84915238189&partnerID=MN8TOARS