The characterization of structural disorder in thin films at elevated temperatures by spectroscopic methods
Journalartikel
Details zur Publikation
Autor*innen: Rabolt J, Rabe J, Brown C, Swalen J
Zeitschrift: Proceedings of SPIE - The International Society for Optical Engineering
Jahr der Veröffentlichung: 1985
Bandnummer: 553
DOI: 10.1117/12.970931
URL: http://www.scopus.com/inward/record.url?eid=2-s2.0-84915238189&partnerID=MN8TOARS