CRC 951/2: HIOS – Transmission Electron Microscopy of HIOS (SP Z02)

This project will provide transmission electron microscopy (TEM) service for the structural and chemical characterization of HIOS to the CRC. The knowledge of the structural and chemical properties of HIOS is essential for the thorough understanding of their electronic and optical properties. In close cooperation with the partner projects of the CRC state-of-the-art TEM techniques exhibiting nanoscale spatial resolution will be applied. Since HIOS are extremely challenging for TEM analysis methodological developments have to be made. In this project low-dose TEM techniques will be further improved and adapted for HIOS characterization on the nanometre scale.