Compressed Sensing in Ptychography and Transmission Electron Microscopy

This project uses compressed sensing to improve object retrieval from ptychographic data sets consisting out of HRTEM images and diffraction patterns, and to speed up data recording and thus decrease electron dose and specimen damage. More specifically, a SEM will be equipped with fast phase imaging in transmission, and super-resolution will be attained in the TEM by near-field ptychography. After having validated the techniques with standard samples of increasing complexity, the challenging case of metal and metal oxide clusters synthesized in the gas phase by laser evaporation cluster sources is taken on.

Principal Investigators
Van den Broek, Wouter (Details) (Experimental Physics / Structural Research and Electron Microscopy)

Further project members
Koch, Christoph T. Prof. PhD (Details) (Experimental Physics / Structural Research and Electron Microscopy)

Duration of Project
Start date: 07/2017
End date: 03/2021

Research Areas
Condensed Matter Physics

Research Areas

W. Van den Broek, B. W. Reed, A. Béché, A. Velazco, J. Verbeeck and C. T. Koch, "Various Compressed Sensing Setups Evaluated Against Shannon Sampling Under Constraint of Constant Illumination," in IEEE Transactions on Computational Imaging, vol. 5, no. 3, pp. 502-514, Sept. 2019.

W. Van den Broek, B.W. Reed, A. Béché, J. Verbeeck, C.T. Koch. “Viability of Compressed Sensing as a Dose Reduction Strategy in STEM.” Microscopy and Microanalysis 25(S2)(2019), 1686–1687.

W. Van den Broek, M. Schloz, T.C. Pekin, P.M. Pelz, P.-H. Lu, M. Kruth, V. Grillo, R.E. Dunin-Borkowski, R.J.D. Miller, C.T. Koch. “Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm.” Microscopy and Microanalysis 25(S2) (2019) 58–59.

Last updated on 2021-04-01 at 17:44